Dataset Summary Description Data and Resources Subjects Fields of Research Keywords Socio-economic Objectives Organisations & Groups Related Collections: Recently updated collections Organisation Summary Description Related Collections: Recently updated collections Related Datasets: Recently updated datasets Related Projects: Recently updated projects JavaScript is not enabled This application requires Javascript, however the system has detected that Javascript is not enabled on the browser. Please follow these instructions on how to enable Javascript. After Javascript has been enabled, press F5 to reload this page to make this message disappear. ServicesPHI TRIFT V - nanoTOF - Time-Of-Flight Secondary Ion Mass Spectrometry PHI TRIFT V - nanoTOF - Time-Of-Flight Secondary Ion Mass Spectrometry Future Industries Institute http://fii.unisa.edu.au/ A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences. ToF-SIMS is an analytical technique used to image and record organic and inorganic mass spectral data of solid materials. It is a highly sensitive technique that provides chemical information regarding elemental, isotopic and molecular structure from the top 1-2 nanometres of a surface. Related Records This service has contributed to the following datasets Advanced Nanoscale Materials Engineered From Diatomaceous Earth Dataset Development of materials engineering solutions for treatment of Murray-Darling Basin sourced water supplies dataset Energy Dissipation and Nanoscale Process Dataset This service is related to the following organisations Partner organisations: Future Industries Institute